Design for At-Speed Test, Diagnosis and Measurement
This book offers practical and proven design-for-testability (DFT) solutions and is a must-read for chip and system design engineers, test engineers and product managers. The book provides helpful information for those working both at the silicon level as well as at board and systems levels, and includes a complete design flow and analysis of the impact of embedded test on a design.
Designers will learn how embedded test can simplify silicon debug and system bring-up. Test engineers will see the superior level of at-speed test, diagnosis and measurement possible through embedded test. Product managers will discover the savings in time, resources and costs associated with test development, manufacturing and lifecycle maintenance by designing embedded test in the product.
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