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Article Archives

06/21/07	Design for debugging: the unspoken imperative in chip design
01/03/07	Testing at 65mn: Are you feeling lucky?
10/30/06	LogicVision tool plumbs test data for clues on IC yields
10/23/06	Nanometer ICs stress test
09/01/06	Is DFT the key to reducing test costs?
07/06/06	DFT is a DFM Issue, Too
06/06/06	LogicVision expands beyond BIST niche
06/05/06	Embedded test memory targeted at advanced technology nodes
05/08/06	Scheme eyes test tool mix and match
03/24/06	WallSt.net Audio Interview with LogicVision
03/03/06	Yield Analysis Automation
12/12/05	FullBIST to FieldBIST - A Design Methodology for Fast Cycle Time to High Volume Production and Profitability
11/01/05	Magma, LogicVision complete product integration
10/15/05	Reducing Leakage-Induced Field Returns
10/01/05	Design Meets Test
07/01/05	Comprehensive Characterization Analysis Ensures Fast Yield Ramps
05/30/05	SILICON ENGINEERING: Built-in self-test migrates to RT level
05/09/05	The New DFT Reality at 90nm
03/07/05	Yield: The Key to Nanometer Profits
11/03/04	EDA Firms Vie with ATE Makers on ITC Exhibit Floor