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SPECIFIC SOLUTIONS:


MEMORY TEST & REPAIR
The industry’s most advanced memory test and repair capabilities.

TEST FOR LOW DPM
Addresses today’s growing quality and time-to-market challenges.

EMBEDDED DRAM SELF-TEST
Comprehensive solution for testing and repairing any 3rd party eDRAMs.

AUTOMOTIVE ELECTRONICS TEST
Solutions for today’s automotive semiconductor.

HIGH-SPEED I/O TEST
The test solution for all SerDes and DDR interfaces.

PLL TEST
Ensure the performance of your IC by accessing and testing its PLLs.

LogicVision is the leader in enabling highest silicon quality while reducing test costs and time to production.  LogicVision’s BIST (built-in-self-test) solutions for Memory, Logic and SerDes enable single-digit DPM (defects per million) quality levels, improve profit margins by reducing device field returns and test costs, shorten time-to-market and time-to-yield by accelerating silicon bring-up and diagnostics. We make money for our customers.

We enable Silicon Quality at the Right Cost.

NEW DEMO
Silicon Insight Demo
Interactive Silicon Debug and Characterization with Silicon Insight Desktop
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Be ready for the explosion in embedded memories
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Expect more from your test solution
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Worried about power during at-speed logic test?

Memory Repair with Power Management

Tips on Memory Repair

LogicVision's Memory BIST & Automated Diagnosis Solutions Included by TSMC in Its Advanced Embedded Memory Development Program and QA Flow

Mentor Graphics and LogicVision Sign Definitive Merger Agreement

Introducing Dragonfly
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The Embedded Path to Low DPM and Fast Silicon Bring-Up

Memory Repair Primer: A Guide to Understanding Embedded Memory Repair Options and Issues